Introspect Technology Introduces Second-Generation DDR/LPDDR Protocol Analyzer Offering the Highest Sampling Rate in the Industry

MONTREAL, Ju e 30, 2026 (GLOBE NEWSWIRE) — I t ospect Tech ology, a JEDEC^® membe a d a leadi g ma ufactu e of test a d measu eme t i st ume ts, is p oud to i t oduce the M7030 DDR/LPDDR P otocol A alyze , a evolutio a y solutio fo desig validatio a d i te ope ability testi g of ext-ge e atio memo y i te faces. Usi g this compact a d highly ve satile i st ume t, chip ma ufactu e s, memo y make s, a d system o igi al equipme t ma ufactu e s (OEM) o the fo ef o t of memo y i te face tech ology a e able to apidly b i g up LPDDR, DDR, GDDR, a d HBM devices, a d they a e able to debug p otocol timi gs a d pe fo m lo g-te m data i teg ity testi g. A d by offe i g the highest sampli g ate i the i dust y, the M7030 P otocol A alyze is eady fo ext-ge e atio specificatio s such as LPDDR6 a d the highly a ticipated DDR6 specificatio .

Next ge e atio memo y i te faces a e cu e tly bei g deployed i to a wide a ge of system applicatio s, a d this is c eati g a pa adigm shift i desig , validatio , a d i te ope ability testi g. Mo e complex p otocols, apidly i c easi g data ates, a d ext emely tight ma gi s a e all c eati g a eal challe ge fo effectively validati g the digital pe fo ma ce of systems. This is whe e the M7030 DDR/LPDDR P otocol A alyze comes i to the pictu e. It is a evolutio a y i st ume t that is desig ed like a oscilloscope i the a alog domai a d that is delive ed as a high cha el cou t, high sampli g ate logic a d p otocol a alyze i the softwa e domai .

“The M7030 i st ume t is I t ospect’s latest i te p etatio of the mode p otocol a alyze , a d we a e th illed to i t oduce it to ou use s wo ldwide,” said D . Mohamed Hafed, CEO at I t ospect Tech ology. “Desig ed f om the g ou d up by I t ospect’s e gi ee s wo ki g closely with thei cou te pa ts at leadi g memo y a d p ocesso ma ufactu e s, this p oduct t uly acce tuates I t ospect’s u ique desig philosophy, its ema kable teste a chitectu e, a d its lege da y Pi et ee™ softwa e e vi o me t,” he co ti ued.

The M7030 P otocol A alyze p ovides i sta t i sight i to a y live system that co tai s high-speed memo y i te faces. With t ai i g-f ee ope atio , it t acks all phases a d all voltage levels of a memo y i te face automatically. The followi g a e additio al key featu es a d thei be efits:

I dust y-Leadi g Sampli g RateWith a ative sampli g ate of 80 GS/s pe pi , the M7030 ca be used to debug a d diag ose the fastest memo y li ks i the wo ld. A high sampli g ate i c eases the co fide ce i measu eme ts a d also helps with futu e p oofi g the equipme t fo yea s to come.

Active P obi g a d I teg ated-Tip I te pose sWith ew impleme tatio s of LPDDR5 a d LPDDR6 memo ies elyi g o u te mi ated mode fo some of the sig als u de test, attachi g a y logic a alyze to the i te face becomes a ightma e fo e gi ee s. Howeve , with the M7030’s active p obe tech ology a d i teg ated-tip i te pose s, this solutio is able to p obe a d debug u te mi ated sig als i a memo y i te face.

Ha dli g Clock Stops a d I sta ta eous Clock F eque cy Cha gesThe M7030’s u ique sampli g a chitectu e allows it to automatically deal with clock stops, a behavio that is becomi g so pe vasive i ext-ge e atio low-powe memo y i te face impleme tatio s. Additio ally, the M7030 ca also deal with i sta ta eous clock f eque cy cha ges, thus e abli g e gi ee s to test ealistic system-level ope ati g co ditio s, as opposed to a tificial fixed-f eque cy “test” modes.

The M7030 DDR/LPDDR P otocol A alyze is pa t of I t ospect Tech ology’s g owi g M Se ies p oduct li e, a se ies of massively pa allel p oducts fo testi g high data ate, high cha el cou t devices a d systems. It is cu e tly shippi g a d is available fo pu chase immediately by co tacti g ou global sales pa t e s o eachi g to us di ectly at i fo@i t ospect.ca.

About I t ospect Tech ologyI t ospect Tech ology c eates i ovative elect o ic test a d measu eme t equipme t. Whethe it is the ext augme ted eality headset o the high-ba dwidth memo y i a se ve blade, ou awa d-wi i g tools a e used to develop, test, a d ma ufactu e ext-ge e atio p oducts. By elimi ati g t aditio al testi g ba ie s, we help the leadi g global tech ology compa ies make tomo ow’s tech ology today’s possibility.

A photo accompa yi g this a ou ceme t is available at https://www.globe ewswi e.com/NewsRoom/Attachme tNg/e93fc8e8-4cf8-4a4a-8106-066976939af6

A video accompa yi g this a ou ceme t is available at https://www.globe ewswi e.com/NewsRoom/Attachme tNg/cc216ce1-6259-4f69-a713-edb2d91b07d5