Michael Lee Bushnell, PhD, shared his professional achievements and industry expertise in Forbes magazine
Recently establishing Spectral Chip Test Research LLC, a company endeavoring to reduce the cost of testing huge integrated circuits, Dr. Bushnell holds eight U.S. patents and one European patent.
PRINCETON JUNCTION, NJ, November 07, 2025 /24-7PressRelease/ — Michael Lee Bushnell, PhD, founder and chief technology officer of Spectral Chip Test Research, LLC and professor emeritus of Rutgers, the State University of New Jersey, was selected by Marquis Who’s Who for a prominent feature in the San Francisco regional edition of Forbes magazine.
Leveraging 50 years of professional experience, Dr. Bushnell is distinguished for his expertise in the fields of engineering, academia and technology. From 2008 to 2022, he served as the co-founder and chief technology officer at Spectral Design and Test Inc., where he specialized in ultra-large integrated circuits at the analog and digital levels and the testing and synthesizing of such circuits.
Concurrently, since 2013, Dr. Bushnell has been recognized as a professor emeritus at Rutgers, the State University of New Jersey, having spent 27 years at the university beginning in 1986 as a professor in the electrical and computer engineering department. During his tenure at Rutgers, he also served in the university’s CAIP Research Center, the Wireless Information Networks Laboratory and the Rutgers Center for Operations Research. Earlier in his career, Dr. Bushnell served as a member of the technical staff in the advanced system development department at Applicon Inc. from 1979 to 1981 and as a senior systems programmer at Instron Corporation from 1976 to 1979. Commencing his career in 1974, he served as an associate engineer in the design automation department at Honeywell Information Systems until 1976.
Recently establishing Spectral Chip Test Research LLC, a start-up company endeavoring to reduce the cost of testing huge integrated circuits, Dr. Bushnell holds eight U.S. patents and one European patent. He is also recognized as a Lifetime Fellow of the Institute of Electrical and Electronics Engineers (IEEE) and, to date, has contributed 29 articles to scientific journals, 78 conference papers in proceedings, 29 technical reports, and 56 invited presentations at various universities, conferences and corporations. Impressively, his paper concerning chip area estimation has been widely used by companies in the chip industry, and his paper regarding delay testing of hardware has been widely cited.
As a testament to his success, Dr. Bushnell has received numerous accolades, including the Fellow Award from the IEEE in 2008 and the Presidential Young Investigator Award from the National Science Foundation in 1990. In 2019, Top 100 Magazine recognized him among the leading academics and industrial researchers. He has also obtained several grants for his research.
EDUCATION HIGHLIGHTS
Dr. Bushnell earned a Bachelor of Science in Electrical Engineering in computer science from the Massachusetts Institute of Technology in 1975. Subsequently, he attended Carnegie Mellon University and received a Master of Science in computer engineering in 1983 and a Doctor of Philosophy in electrical engineering in 1986. Notably, he established a fellowship fund at Carnegie Mellon University in honor of his parents, called the Neil and Jo Bushnell Fellowship, which has funded the education of 40 doctoral students thus far.
TECHNOLOGY TRANSFER
Dr. Bushnell’s Automatic Test-Pattern Generators were transferred to IBM, Texas Instruments, Nippon Electric Co. and Boolean Dynamics. His chip layout area estimation technique is used throughout the chip industry to estimate the chip area needed by a circuit before the physical layout is created. His delay fault testing method is used worldwide by Bell Laboratories to test the circuits driving the fiber optic cables for telephone exchanges and internet switches.
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